MICROSCOPY
LABORATORYÂ
TECHNICAL STAFF
MOHD FERDAUS BIN MD NOR
SCIENCE OFFICER (CA41)
Phone No: 03-2203 1527
Room No: K.X.01.01.31.01
Email: m.ferdaus@utm.my
SKILLS
-
Attend training in electron and optical microscope instruments
RESEARCH / SERVICE EXPERIENCE
MOHAMMAD TAUFIK BIN MOHD SAAD
ASSISTANT ENGINEER (J29)
Phone No: 03-2203 1527
Room No:Â K.X.01.01.31.01
Email: taufik.kl@utm.my
SKILLS
- Attend training in electron and optical microscope instruments
RESEARCH / SERVICE EXPERIENCE
ZAIM BIN MUHAMAD RADZI
ASSISTANT ENGINEER (J29)
Phone No: 03-2203 1527
Room No:Â K.X.01.01.31.01
Email: zaimradzi@utm.my
SKILLS
- Attend training in electron and optical microscope instruments
RESEARCH / SERVICE EXPERIENCE
JUFA ZYHA BINTI MD SALLEH
ASSISTANT SCIENCE OFFICER (CA29)
Phone No: 03-2203 1527
Room No:Â K.X.01.01.31.01
Email: jufazyha@utm.my
SKILLS
- Attend training in electron and optical microscope instruments
RESEARCH / SERVICE EXPERIENCE
FADHILAL HAZIM BIN FAKHRURADZI
ASSISTANT LABORATORY (CA19)
Phone No: 03-2203 1527
Room No:Â K.X.01.01.31.01
Email: fadhilalhazim@utm.my
SKILLS
- Attend training in electron and optical microscope instruments
RESEARCH / SERVICE EXPERIENCE
EQUIPMENTS
FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPE (FETEM)
Brand: JEOL
Model: JEM-2100F
Function:
- Ultrahigh resolution in scanning transmission microscopy and nano-scaled sample.Â
- Simplifies atomic level structural analyses in biology, medicine, and materials sciences.
- Provide ease of use tilt, rotation, heating and cooling, as well as programmable multi-point settings.
- Able to equip with STEM, MDS, EDS, and CCD-cameras.
DUALBEAM SCANNING ELECTRON MICROSCOPE/FOCUSED ION BEAM (FIB-SEM)
Brand: FEI
Model: HELIOS NANOLAB G3 UC
Function:Â
- Reveal the finest nanoscale details in 2D and 3D images with clearest contrast.
- Prepare the thinnest and highest quality samples to access the most accurate atomic information.
- For a wide range of materials including metals, polymers, nanotubes, particles of ceramics.
FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)
Brand: JEOL
Model: JSM-7800F
Function:Â
- Observe the finest structural  morphology of nano-materials at 1,000,000X magnification.
- Collect large area EBSD maps at low magnifications
- Perform low kV imaging and analysis of highly magnetic samples and image.
LOW VACUUM SCANNING ELECTRON MICROSCOPE (LV-SEM)
Brand: JEOL
Model: JSM-IT300
Function:Â
- High resolution of 3.0nm at 30kV and unsurpassed low kV performance.
- Deliver amazing clarity for imaging the finest structures.
- High resolution across the magnification range of 5X – 300,000X.
3D MEASURING LASER MICROSCOPE
Brand: OLYMPUS
Model: LEXT OLS4100
Function:
- To perform non-contact 3D measurement of complex surface.
- Guarantees both repeatability and accuracy.
- Obtain 3D images automatically and an image acquisition speed that is approximately twice as fast as the existing Olympus models.
FLUORESCENCE MICROSCOPE
Brand: Olympus
Model: BX53
Function:Â
- To determine localization and distribution of small organisms.
- Use to study ion concentrations and the process occurs inside or between the cells.
ATOMIC FORCE MICROSCOPY (AFM)
Brand: Bruker
Model: Multimode 8
Function :
- For measuring the surface topography with high resolution.
- Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level.
DIGITAL MICROSCOPE
Brand: OLYMPUS
Model: DSX510
Function:Â
- Provide observation, image capturing, measurement, and sharing.
- Deliver efficient observation, intuitive magnifying operation, a variety of observation methods, and reproducibility.
- Include EFI and 3D imaging, wide area image capturing, movie capturing, and programmed image capturing.
STEREO ZOOM MICROSCOPE
Brand : NIKONÂ
Model: SMZ745T
Function:Â
- Well suit for industrial and biomedical applications.
- Produce brighter images with higher contrast.
- Capable to use in environment where the temperature and humidity are high due to anti-mold design.