We are happy to invite you and your colleagues to participate in a two-day workshop on Nano-Analysis and Characterization of Materials by Using FESEM and EDS, to be held on 19th to 20th of October 2016 at Blok T03, UIRL, Universiti Teknologi Malaysia, Johor Bahru Campus.
In this course, you will learn about the FESEM and EDS fundamentals and get hands on training with FESEMCrossbeam 340 from ZEISS.
The Crossbeam 340 is a powerful version of Scaning Electron Microscope that also have FIB function usually use for TEM sample preparation. The feature outstanding speed in material analysis and processing for a wide diversity of applications.
The Crossbeam 340 combines the imaging and analytical performance of the GEMINI column with the nanoscopic material processing and sample preparation of a next generation FIB.
More details about the workshop can be found in the brochure as attached.
We are looking forward for your participation! Thank you.
Participation Form : Click Here
Tentative : Click Here