Invitation to Workshop on Sample Preparation For
High Resolution Transmission Electron Microscope
(JEOL ARM 200F)
10-11 January 2017
Microscopy & Imaging Laboratory
University Industry Research Laboratory (UIRL)
We are happy to invite you and your colleagues to participate in a two-day workshop on Sample Preparation For High Resolution Transmission Electron Microscope, to be held on 10th to 11th of January 2017 at Blok T03, UIRL, Universiti Teknologi Malaysia, Johor Bahru Campus.
In this course, you will learn how to prepare the TEM specimen. Sample preparation in TEM can be a complex procedure. TEM specimens are required to be at most hundreds of nanometers thick. High quality samples will have a thickness that is comparable to the mean free path of the electrons that travel through the samples, which may be only a few tens of nanometers. Preparation of TEM specimens is specific to the material under analysis and the desired information to obtain from the specimen. As such, a few standard techniques have been used for the preparation of the required thin specimens. Therefore, this workshop is COMPULSORY for those who want to run analysis using TEM at UIRL.
The HR TEM JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.
For more details about the workshop can be found in the brochure as attached.
We are looking forward for your participation! Thank you.