Invitation to Workshop on Post-Analysis For
High Resolution Transmission Electron Microscope
(JEOL ARM 200F)
Microscopy & Imaging Laboratory
University Industry Research Laboratory (UIRL)
19-20 June 2017
We are happy to invite you and your colleagues to participate in a two-day workshop on Post-analysis For High Resolution Transmission Electron Microscope, to be held on 19th to 20th of June 2017 at Blok T03, UIRL, Universiti Teknologi Malaysia, Johor Bahru Campus.
In this course, participant will be teaching how to interpret the data by using off-line software. The analysis not only can be done while observation but more of the analysis can make by using off-line software. This makes post-analysis TEM very important. Therefore, this workshop is COMPULSORY for those who want to run analysis using TEM at UIRL.
The HR TEM JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.
For more details about the workshop can be found in the brochure as attached.
We are looking forward for your participation! Thank you.