ATOMIC FORCE MICROSCOPY (AFM)
BRAND:
Description of Equipment
Atomic Force Microscopy (AFM) is a high-resolution technique for nanoscale surface imaging, utilizing a sharp probe. It operates in contact, tapping, and non-contact modes.
Service Charge
RM200 per sample
For further information, kindly reach out our person-in-charge.
SITI ZHAHARA BINTI SALLEH
szhahara@utm.my
07-533 3360
NUR SYAKIRAH BINTI MOHD NOH
n.syakirah@utm.my
07-533 3360
DISCLAIMER:
1) Basic charge does not include sample preparation, post analysis and consultation
2) Actual charges are subject to the official quotation issued by UIRL laboratory
Effective date: 21 January 2024
Office Address
T03 Building,
University Industry Research Laboratory,
Universiti Teknologi Malaysia,
81310 Skudai,
Johor, Malaysia.
UIRL counter hours
MONDAY – THURSDAY :
8.30am – 12.30pm
2.30pm – 4.30 pm
FRIDAY :
8.30am – 12.30pm
2.30pm – 4.30 pm
Contact us
UIRL Counter :
07-533 3360
