FOCUS ION BEAM-FIELD EMISSION SCANNING ELECTRON MICROSCOPE WITH EDS (FIB-FESEM EDS)
BRAND: Zeiss Crossbeam 340
Description of Equipment
A powerful Scanning Electron Microscope with FIB function for TEM sample preparation, featuring outstanding speed in material analysis and processing for various applications.
Service Charge
FIB-FESEM Service Charge
RM200 per sample (FESEM)
RM100 per sample (EDX)
RM600 per hour (FIB)
For further information, kindly reach out our person-in-charge.
AL AZHARI BIN AMIR HATIB
alazhari@utm.my
07-561 0268
07-561 0268
AHMAD SAFUAN BIN BORHAN
a.safuan@utm.my
07-5610268
07-5610268
Status : Available | Unavailable
DISCLAIMER:
1) Basic charge does not include sample preparation, post analysis and consultation
2) Actual charges are subject to the official quotation issued by UIRL laboratory
Effective date: 21 January 2024
Office Address
T03 Building,
University Industry Research Laboratory,
Universiti Teknologi Malaysia,
81310 Skudai,
Johor, Malaysia.
UIRL counter hours
SUNDAY – WEDNESDAY :
8.30am – 12.30pm
2.30pm – 4.30 pm
THURSDAY :
8.30am – 12.30pm
2.15pm – 3.30 pm
Contact us
UIRL Counter :
07-5557583