Scanning/Transmission Electron Microscope Laboratory
Details of Instrument
The JEM-ARM200F ia an Atomic Resolution Microscope (ARM) enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates STEM with Cs correlation for atomic spatial energy resolution combined with high probe current for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.
Please refer to P.I.C for quotation.
9.00 a.m. – 4.30 p.m.
Norshilyla Binti Mohd. Jailani
Nur Hidayah binti Azmi
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