FIELD-EMISSION SCANNING ELECTRON MICROSCOPE
(FE-SEM)
Brand: Hitachi SU8020
Location
Microscope FE-SEM & VP-SEM Laboratory (01-46-01)
Details of Instrument
Hitachi’s cold field emission technology with double condenser optics ensure the superb resolution and full control of probe current from 1pA to more than 5nA; ideal for observation of sensitive specimens and for elemental analysis (EDX)—where today’s SDD detectors achieve on the order of 10000 to 100000 counts per second.
The instrument offer a variety of stage, specimen chamber and signal detection system configurations to meet the wide range of customer-specific needs for indispensable ultra-high-resolution microscopy in the nanotechnology fields, such as semiconductors, electronics, catalysis and other functional materials, biotechnology, pharmaceuticals, and more.
Service Charge
Please refer to P.I.C for quotation.
Operation Hours
9.00 a.m. – 4.30 p.m.
Status
Available for booking
P.I.C
P.I.C
Ahmad Safuan Bin Borhan
a.safuan@utm.my
07-5610268
Al Azhari bin Amir Hatib
alazhari@utm.my
07-5610268
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