ATOMIC FORCE MICROSCOPY
(AFM)
| No | Details | |
|---|---|---|
| 1 | Location: | Advanced Optical Microscope & Nano Raman Photolumeniscene Laboratory 01-34-01 |
| 2 | Details of Instrument: | Atomic Force Microscope, AFM is a surface technique that using a tiny tip (cantilever) as sensor to investigate surface of a sample. Using AFM, it is possible for us to measure a roughness of a sample surface at a high resolution, in order to distinguish a sample based on its mechanical properties (Eg: hardness and roughness). Example of sample : • microbes • thin film • fabric. |
| 3 | Service Charge | Please refer to P.I.C for quotation. |
| 4 | Operation Hours | Sunday - Wednesday : 9.00am – 1.00 pm 2.00 pm - 4.30pm Thursday: 9.00 am - 1.00 pm 2.00pm - 3.00 pm |
| 5 | Status | Available for booking |
| 6 | P.I.C | Amy Zuria Binti Abdul Ajid amyzuria@utm.my 07-5557589 NUR SYAKIRAH BINTI MOHD NOH n.syakirah@utm.my 07-5557589 |
| 7 | Download Booking Form | Click Here |
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