RAMAN XPLORA PLUS
|1||Location:||Nano Raman-Photoluminescence Spectroscopy Laboratory
|2||Details of Instrument:||Raman-AFM
Raman technology is now integrated with outstanding scanning probe microscopy (SPM). The platform integrates Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS).
What laser wavelengths are used for Raman Xplora Plus?
Visible: 532 nm Nd Yag
Near infra-red: 785 nm Diode
Fully automated cantilever alignment insuring reproducible optimization of the AFM parameters from one tip to the next and from one user to another. (1) (5)
Reliable repositioning of the probe on the sample within seconds. (1) (8)
Drift compensated sample scanner with high resonance frequency brings reproducible images over long periods of time thanks to low vibration sensitivity. (5)
Raman laser alignment by piezo-driven closed-loop objective scanner: shortest distance to the focus point for minimum drift. (6)
Visual confirmation of the Raman laser alignment with independent video imaging, SPM detection and Raman mapping.
|3||Service Charge||Please refer to P.I.C for quotation.|
|4||Operation Hours||Sunday - Wednesday :
9.00 am – 1.00 pm
2.00 pm - 4.30 pm
9.00 am - 1.00 pm
2.00 pm - 3.00 pm
|5||Status||Available for booking|
|6||P.I.C||Amy Zuria Binti Abdul Ajid
Md Razali Bin Rehat
|7||Download Booking Form||Click Here|
Updated on : 31/01/2016