The BX53M maintains the traditional contrast methods of conventional microscopy, such as brightfield, darkfield, polarized light, and differential interference contrast. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. New illumination techniques and options for image acquisition within PRECiV image analysis software give users more choices of how to evaluate their samples and document findings.

Service Charge
RM30 per sample

DISCLAIMER:
1) Basic charge does not include sample preparation, post analysis and consultation
2) Actual charges are subject to the official quotation issued by UIRL laboratory
Effective date: 21 January 2024