X-RAY DIFFRACTOMETER
(XRD)
No | Details | |
---|---|---|
1 | Location: | Advanced X-ray Diffraction Laboratory 01-33-01 |
2 | Details of Instrument: | X-Ray Diffractometer (XRD) A technique used to determine the atomic and molecular structure of a crystal, in which the crystalline atoms cause a beam of incident X-rays to diffract into many specific directions. Basic Principal X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. The interaction of incident rays with the sample produce constructive interference (and a diffracted ray) when condition satisfy Bragg’s Law. Application of XRD • XRD is a non-destructive technique • XRD is most widely used for the identification of unknown crystalline materials • To identify crystalline phases and orientation • To determine structural properties • To determine atomic arrangement |
3 | Service Charge | Please refer to P.I.C for quotation. |
4 | Operation Hours | Sunday - Wednesday : 9.00 am – 1.00 pm 2.00 pm - 4.30 pm Thursday: 9.00 am - 1.00 pm 2.00 pm - 3.00 pm |
5 | Status | Under Maintenance |
6 | P.I.C | Amy Zuria Binti Abdul Ajid amyzuria@utm.my 07-5557589 Mohd Izzam Bin Idrus m.izzam@utm.my 07-7510269 |
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